Webinar Recording Available: Solve your SI & PI challenges using Keysight EEsof EDA Tools

Video recording of my webinar on “Solving your SI & PI challenges” scheduled on 6th April 2017 is now available at my YouTube channel now. Look forward for your comments & suggestions……

You can view the recording here:

For more information:

  1. http://www.keysight.com/find/eesof-ads
  2. http://www.keysight.com/find/eesof-ads-sipro
  3. http://www.keysight.com/find/eesof-ads-pipro

Webinar: Solve your Signal & Power Challenges using SIPro & PIPro

I will be conducting this Webinar on 6th April at 11.00am – 12.30pm (IST). Look forward for your participation.


Keysight Technologies is offering free webinar on 6th April 2017, specifically designed for Signal and Power Integrity Engineers trying to accurately model their printed circuit boards (PCBs), a task that is now more challenging given today’s ever increasing data rates. During the webinar, attendees will learn about SIPro (Signal Integrity Professional) and PIPro (Power Integrity Professional) tools from Keysight Technologies.

SIPro and PIPro provide a cohesive workflow within ADS for signal integrity and power integrity applications in high speed digital board design. Specific use cases will be demonstrated, which will reveal the powerful capabilities of SIPro & PIPro.

Topics to be covered:

– Challenges of increasing speeds & complexity

– Why you need a Channel Simulator

– S Parameters for frequency and time domain data mining

– EM simulation for Signal integrity

– Fast parallel bus DDR4 simulations

– How to Analyze 100 GbE – KP PAM4 vs NRZ

– Power Integrity basics

– Power Integrity IR Drop

Location: At Your PC

How to Register:

Send a mail to tm_india@keysight.com or dial toll free number to register: 1800-11-2626

Webinar: Tolerance Analysis for Planar Microwave Circuits

Webinar: Tolerance Analysis for Planar Microwave Circuits on December 3 at 7 a.m. or 10 a.m. PT (India time: 8.30pm or 11.30pm)

Planar filters and antennas offer the tightest integration and lowest total cost in the majority of integrated RF/Microwave systems. However, tolerance variations in materials, processing, enclosure and environment are often not properly analyzed leading to circuit or system designs that either do not consistently meet specs or are unnecessarily over-spec’d and costly. This is because the task of performing exhaustive tolerance analysis can be intimidating and you may not know where to begin. This presentation provides a framework for automating this process and is illustrated with a 29GHz microstrip filter. The resulting downloadable template provides a robust starting point for you to test your designs against suspected sources of variation and determine which ones have the strongest influence. This methodology makes "build vs. buy" and material/process selection more deterministic and efficient.

Who Should Attend:

RF/Microwave circuit and system board level engineers, planar antenna designers, RF/Microwave system engineers, engineering managers

Click here to Register: Register Now

Webinar News

Date: 22nd May 2012

Time: 11am – 12pm (IST, GMT+5.30)

Abstract: GaN devices are gaining rapid popularity for Power Amplifier design applications and one of the reasons is that GaN devices provides more reliability as compared to other competing technologies. During the webinar we shall present a design case study using RFMD GaN device & discuss a step by step procedure to design GaN PAs using ADS 2011. We shall also discuss various Load Pull techniques in detailed manner which is a very important step in designing Power Amplifiers.

Date: 19th June 2012

Topic: EM based designs using Agilent ADS and EMPro 2011

Time: 11am – 12pm (IST, GMT+5.30)

Abstract: EM simulations are inherent part of high frequency design applications. Enhancements made in ADS2011 release makes EM simulations pretty easy so that every RF designer can feel comfortable to use the power and accuracy of EM simulations in their RF designs. Also, fully integrated Finite Element Method (FEM) simulator in ADS2011 is very useful to simulate non-planar structures/assemblies without having the need to leave ADS environment and paves the way to perform Circuit/Planar EM/3D EM co-simulation with great ease. Also for certain type of complicated assemblies ADS and EMPro integration can be used pretty effectively which offer full design inter-operability without indulging into complex and time consuming process of doing file transfer between the tools etc.

During the course of webinar we shall present tips and tricks for successful and accurate EM simulations using Method of Moments and FEM simulators in ADS2011 and also demonstrate ADS-EMPro link for complex 3D structures.

Date: 24th July 2012

Topic: RF System Architecture & Budget Analysis using Agilent SystemVue

Time: 11am – 12pm (IST, GMT+5.30)

Abstract: Accurate RF System Architecture analysis is the first key step towards 1st pass design success for RF Systems. Agilent SystemVue provides all the key features to perform RF Architecture and System Budget analysis with great ease.

During the course of the webinar we shall discuss the key challenges faced by RF system designers and showcase how Agilent SystemVue handles such complicated analysis with great ease of use. We shall also discuss how to perform Digital/DSP and RF system co-simulation and tackle various potential RF & DSP integration issues so that we can troubleshoot them early in design cycle.

To Register: https://agilent-technologies.webex.com/mw0306ld/mywebex/default.do?nomenu=true&siteurl=agilent-technologies&service=6&rnd=0.012961748207907409&main_url=https://agilent-technologies.webex.com/ec0605ld/eventcenter/event/eventAction.do?theAct

Webinar: Practical RF Circuit Designing

Here is the details of upcoming webinar from Agilent Technologies, all interested are invited to attend….

Title: Practical RF Circuit Designing

Time: 11am – 12noon (India Time Zone, GMT+5.30)

Date: 27th March 2012

Abstract: Designing RF circuits is often seen as a challenging task and to make RF circuits meet desired specifications with component tolerances is even more challenging. During the course of Webinar we shall present a practical approach of higher

yield RF circuit design.

How to join: Register Here

Happy Designing…..

Webcast: Moving to Non-Signaling Manufacturing Test for Wireless Devices

Title: Moving to Non-Signaling Manufacturing Test for Wireless Devices

Date: February 23, 2012
Time: 10 AM PT/ 1 PM ET/ 6 PM UTC
Presented by: Agilent Technologies
Presenter: Jim McCord, Product Manager, Agilent Technologies

Webcast Description:

As wireless devices rapidly evolve, more wireless bands and formats are being implemented on chipsets used in smart phones, tablets, and other wireless communication devices. Manufacturers are looking for cost-effective ways to test these complex devices while moving them quickly into volume manufacturing. Non-signaling test is widely accepted as the fastest, most cost-effective technique for testing current and next-generation wireless devices in manufacturing.

This presentation discusses the requirements to effectively implement non-signaling test including:

  • What is non-signaling test?
  • Chipset test capabilities, now and future
  • Required test equipment capabilities
  • Tools and techniques to maximize throughput with minimum effort

Register Here

Webcast: IEEE 802.11ad PHY Layer Testing

IEEE 802.11ad PHY Layer Testing

Webcast Description:

We start with a brief tutorial introduction to the IEEE 802.11ad PHY layer, and then we review a variety of modulation analysis measurements, considering what each can tell us about the device under test.

Who should attend:

  • Anyone currently developing or considering an implementation of the IEEE 802.11ad or WiGig 1.1 PHY
  • Anyone seeking to debug or verify an IEEE 802.11ad or WiGig 1.1 PHY implementation
  • Anyone wishing to exercise RF components or subsystems that are designed to process IEEE 802.11ad or WiGig 1.1 PHY compliant signals

Register Here