Webcast: Moving to Non-Signaling Manufacturing Test for Wireless Devices

Title: Moving to Non-Signaling Manufacturing Test for Wireless Devices

Date: February 23, 2012
Time: 10 AM PT/ 1 PM ET/ 6 PM UTC
Presented by: Agilent Technologies
Presenter: Jim McCord, Product Manager, Agilent Technologies

Webcast Description:

As wireless devices rapidly evolve, more wireless bands and formats are being implemented on chipsets used in smart phones, tablets, and other wireless communication devices. Manufacturers are looking for cost-effective ways to test these complex devices while moving them quickly into volume manufacturing. Non-signaling test is widely accepted as the fastest, most cost-effective technique for testing current and next-generation wireless devices in manufacturing.

This presentation discusses the requirements to effectively implement non-signaling test including:

  • What is non-signaling test?
  • Chipset test capabilities, now and future
  • Required test equipment capabilities
  • Tools and techniques to maximize throughput with minimum effort

Register Here

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