Active Device Characterization in Pulsed Operations

Download Agilent’s new white paper, Active Device Characterization in Pulsed Operations Using the PNA-X to learn more about pulsed S-parameter measurements using the PNA-X Series and measurement techniques that enable accurate power-dependent active-device characterization including compression and distortion. This paper includes a brief summary of pulsed-RF measurement types, and also explains two detection techniques (wideband and narrowband detection) using the PNA-X architecture and methodologies.

Download it from: http://www.home.agilent.com/agilent/editorial.jspx?cc=US&lc=eng&ckey=1842163-1-eng&nid=-536902643.426031.02&id=1842163-1-eng&cmpid=40447

Amkor QFN Package Kits for Agilent ADS

Amkor Technology is a leading provider of semiconductor assembly and test services to semiconductor companies and electronic OEMs. More information on Amkor is available from the company’s website at http://www.amkor.com/go/about-us.

Please visit the Amkor Technology website directly for downloading the latest ADS Package Design Kits.

Package Design Kits Available From Amkor Technology

· Quad-Flat No-Lead (QFN) Package Design Kit for ADS

o For Amkor QFN Design Kit requests online, refer to: http://www.amkor.com/go/ads

Press Releases

· Amkor Technology Announces Availability of First Ever QFN Package Design Kit for Advanced Design System

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