Active Device Characterization in Pulsed Operations

Download Agilent’s new white paper, Active Device Characterization in Pulsed Operations Using the PNA-X to learn more about pulsed S-parameter measurements using the PNA-X Series and measurement techniques that enable accurate power-dependent active-device characterization including compression and distortion. This paper includes a brief summary of pulsed-RF measurement types, and also explains two detection techniques (wideband and narrowband detection) using the PNA-X architecture and methodologies.

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Order free CD of Agilent EEsof’s popular “Innovations in EDA” webcast series

If you missed to attend Agilent’s “Innovation in EDA” series of webcasts done over last 1 year. You can order CD of these recorded webcasts at no-cost from the link below:

Happy Designing….

Amkor QFN Package Kits for Agilent ADS

Amkor Technology is a leading provider of semiconductor assembly and test services to semiconductor companies and electronic OEMs. More information on Amkor is available from the company’s website at

Please visit the Amkor Technology website directly for downloading the latest ADS Package Design Kits.

Package Design Kits Available From Amkor Technology

· Quad-Flat No-Lead (QFN) Package Design Kit for ADS

o For Amkor QFN Design Kit requests online, refer to:

Press Releases

· Amkor Technology Announces Availability of First Ever QFN Package Design Kit for Advanced Design System

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