Active Device Characterization in Pulsed Operations

Download Agilent’s new white paper, Active Device Characterization in Pulsed Operations Using the PNA-X to learn more about pulsed S-parameter measurements using the PNA-X Series and measurement techniques that enable accurate power-dependent active-device characterization including compression and distortion. This paper includes a brief summary of pulsed-RF measurement types, and also explains two detection techniques (wideband and narrowband detection) using the PNA-X architecture and methodologies.

Download it from: http://www.home.agilent.com/agilent/editorial.jspx?cc=US&lc=eng&ckey=1842163-1-eng&nid=-536902643.426031.02&id=1842163-1-eng&cmpid=40447

Advertisements

One thought on “Active Device Characterization in Pulsed Operations

Leave a Reply

Fill in your details below or click an icon to log in:

WordPress.com Logo

You are commenting using your WordPress.com account. Log Out / Change )

Twitter picture

You are commenting using your Twitter account. Log Out / Change )

Facebook photo

You are commenting using your Facebook account. Log Out / Change )

Google+ photo

You are commenting using your Google+ account. Log Out / Change )

Connecting to %s