Active Device Characterization in Pulsed Operations

Download Agilent’s new white paper, Active Device Characterization in Pulsed Operations Using the PNA-X to learn more about pulsed S-parameter measurements using the PNA-X Series and measurement techniques that enable accurate power-dependent active-device characterization including compression and distortion. This paper includes a brief summary of pulsed-RF measurement types, and also explains two detection techniques (wideband and narrowband detection) using the PNA-X architecture and methodologies.

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